- THE MAGAZINE
- INFO FOR...
- ASI Store
- ASI Top 25
- ASI End User
- Classifieds and Services Marketplace
- Product & Literature Showcases
- List Rental
- Market Trends
- Custom Content & Marketing Services
- ASI Readers' Choice Awards
Special Events Several keynotes and executive panels are slated for the event. The opening keynote, “From Ghz. to Systems to Solutions: Our Industry in Transition,” will be presented at 9:00 a.m. on July 13 by Bernard S. Meyerson, Ph.D., an IBM fellow and vice president of Innovation and Global University Relations for IBM Systems and Technology Group. At 1:00 p.m., an executive summit moderated by SEMI North America president Jonathan Davis will discuss strategic business and technology issues influencing the supply chain from consumer to manufacturing technology.
At 1:30 p.m. on July 14, Paolo A. Gargini, Ph.D., chairman of the International Technology Roadmap for Semiconductors (ITRS) and director of Technology Strategy at INTEL will give a talk entitled “Welcome to the Next Decade!”
ASMC Co-Located with SEMICON This year, the 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2010) will be co-located with SEMICON West for the first time. ASMC provides a venue for industry professionals to network, learn, and share knowledge on new and best-method semiconductor manufacturing practices and concepts. The conference synergy leads to understandings and relationships that can benefit participating companies in a variety of ways, including accelerating innovation, promoting successes, and getting a more thorough understanding of standards and benchmarks.
Keynotes at the event will include: “High Density 3D Through Silicon Stacking – Manufacturing Readiness and Challenges,” presented by Matt Nowak, director of Engineering in the VLSI Technology Group, Qualcomm; and “CMOS Transistor Scaling Past 32 nm and Implications on Variation,” given by Kelin Kuhn, Intel fellow and director of Advanced Device Technology at Intel Corp.
Technical sessions will include: Advanced Metrology Advanced Process Control Advanced Processes and Materials Contamination Free Manufacturing Defect Inspection I and II Design for Manufacturing and Lithography Fab Optimization Interactive Poster Session Reducing Cost and Maximizing Equipment Productivity
For more information and a full list of exhibitors, visit www.semiconwest.org.