Adhesives Magazine

RADTECH: UV Measurement Microsite

December 20, 2012

This organization has launched a new ultraviolet (UV) measurement microsite, which offers information and tools for the understanding and implementation of UV process and control used in a growing number of industrial applications.

“This comprehensive new site offers a tremendous introduction to UV technology, as well as in-depth practical documentation on the importance and methods of measurement to develop process controls,” said Howard Ragin, president of RadTech. “This new site is truly a tremendous contribution to the advancement of our technology, and is due to the tireless efforts of our UV Measurement Development Team: R.W. Dick Stowe, Fusion UV Systems; Robin Wright, 3M; and Jim Raymont, EIT Inc.”

For additional information, visit www.uvmeasurement.org.