A new series of high-end energy dispersive X-ray fluorescence spectrometers is now available. Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers reportedly offer excellent sensitivity, resolution, and throughput for a range of applications, including general screening analysis and advanced materials research.
The EDX-7000/8000 systems’ new state-of-the-art semiconductor detector (SDD) offers a high fluorescent X-ray count per unit time. This can enable precise, high-resolution analysis while increasing throughput by as much as a factor of 10 compared to the company’s predecessor unit. This speed can allow researchers and labs to increase their productivity without sacrificing accuracy. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen, thereby reducing operating costs and maintenance requirements.
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